| Hauptseite > GSI as publisher > Quality assurance of CBM-STS silicon micro-strip sensors using pulsed infra-read laser |
| Contribution to a book/Internal Report | GSI-SR2014-MU-NQM-CBM-35 |
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2015
GSI Helmholtzzentrum für Schwerionenforschung
Darmstadt
Please use a persistent id in citations: doi:10.15120/GR-2015-1-MU-NQM-CBM-35
Report No.: GSI Report 2015-1
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