Journal Article

GSI-2016-00200

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Automatic intrinsic calibration of double-sided silicon strip detectors

Reese, M.GSI* ; Gerl, J.GSI* ; Golubev, P. ; Pietralla, N.

2015
North-Holland Publ. Co. Amsterdam

This record in other databases:

Please use a persistent id in citations: doi:10.1016/j.nima.2015.01.032

Note: Supported by the German Federal Ministry for Education and Research under Grant no. 05P12RDFN8 (TP6), NuSTAR.de.

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Contributing Institute(s):

1. Kernspektroskopie (KSP)

Research Program(s):

1. 632 - Detector technology and systems (POF3-632) (POF3-632)
2. HIC4FAIR - HIC for FAIR - Helmholtz International Center for FAIR - Data Analysis, Theory and Simulations (LandHessen-LOEWE-HIC4FAIR) (LandHessen-LOEWE-HIC4FAIR)

Appears in the scientific report 2015

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Database coverage:
; Current Contents - Engineering, Computing and Technology ; Current Contents - Physical, Chemical and Earth Sciences ; IF < 5 ; JCR ; NCBI Molecular Biology Database ; Nationallizenz ; SCOPUS ; Science Citation Index ; Science Citation Index Expanded ; Thomson Reuters Master Journal List ; Web of Science Core Collection

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