Journal Article

GSI-2017-00783

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Defect accumulation in swift heavy ion-irradiated CeO$_2$ and ThO$_2$

Palomares, R. I. ; Shamblin, J. ; Tracy, C. L. ; Neuefeind, J. ; Ewing, R. C. ; Trautmann, C.GSI* ; Lang, M. (Corresponding author)

2017
RSC London [u.a.]

This record in other databases:

Please use a persistent id in citations: doi:10.1039/C7TA02640D

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Contributing Institute(s):

1. Materialforschung (MAT)

Research Program(s):

1. 6214 - Nanoscience and Materials for Information Technology (POF3-621) (POF3-621)

Appears in the scientific report 2017

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Database coverage:
; Allianz-Lizenz / DFG ; Current Contents - Engineering, Computing and Technology ; Current Contents - Physical, Chemical and Earth Sciences ; IF >= 5 ; JCR ; SCOPUS ; Science Citation Index ; Science Citation Index Expanded ; Thomson Reuters Master Journal List ; Web of Science Core Collection

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