Heavy Ion Radiation Effects on Hafnium Oxide-Based Resistive Random Access Memory

Petzold, Stefan Sharath, S. U. Lemke, Jonas Hildebrandt, Erwin Trautmann, Christina Alff, Lambert

MAT

IEEE transactions on nuclear science

IEEE

New York, NY

1558-1578

10.1109/TNS.2019.2908637

English 1715 - 1718 7 66 PUB:(DE-HGF)16, ; 0, ;

WOS:000476782600048

Journal Article

2019

GSI-2019-00806

2019

https://repository.gsi.de/record/219017 https://doi.org/10.1109/TNS.2019.2908637 <Go to ISI>://WOS:000476782600048