Journal Article

GSI-2020-00301

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Annealing of ion tracks in apatite under pressure characterized in situ by small angle x-ray scattering

Schauries, D. ; Afra, B. ; Mota-Santiago, P. ; Trautmann, C.GSI* ; Lang, M. ; Ewing, R. C. ; Kirby, N. ; Kluth, P. (Corresponding author)Extern*

2020
Macmillan Publishers Limited, part of Springer Nature [London]

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Please use a persistent id in citations: doi:10.1038/s41598-020-57600-y  doi:10.15120/GSI-2020-00301

Note: This article is licensed under a Creative Commons Attribution 4.0 International License

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Contributing Institute(s):

1. Materialforschung (MAT)

Research Program(s):

1. 6214 - Nanoscience and Materials for Information Technology (POF3-621) (POF3-621)
2. 632 - Detector technology and systems (POF3-632) (POF3-632)

Appears in the scientific report 2020

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