TY  - JOUR
AU  - Bieker, Johannes
AU  - Forbes, Richard G.
AU  - Wilfert, Stefan
AU  - Schlaak, Helmut F.
TI  - Simulation-Based Model of Randomly Distributed Large-Area Field Electron Emitters
JO  - IEEE journal of the Electron Devices Society
VL  - 7
SN  - 2168-6734
CY  - [New York, NY]
PB  - IEEE
M1  - GSI-2020-01213
SP  - 997 - 1006
PY  - 2019
N1  - "This work is licensed under a Creative Commons Attribution 4.0 License."
LB  - PUB:(DE-HGF)16
UR  - <Go to ISI:>//WOS:000495118900015
DO  - DOI:10.1109/JEDS.2019.2940086
UR  - https://repository.gsi.de/record/234851
ER  -