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Elektronische Struktur und EXAFS-Untersuchungen an vergrabenen Halbleiter-Schichten und Grenzflächen für Bauelemente
| Grant period | 1995-05-01 - 1998-03-31 |
| Funding body | Federal Ministry of Education and Research |
| BMBF | |
| Grant number | grant.8026533 |
| Identifier | G:(BMBF)05622CJB/0 |
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Record created 2021-09-20, last modified 2021-09-22