Journal Article

GSI-2022-00533

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png aPIE: an angle calibration algorithm for reflection ptychography

de Beurs, A. ; Lötgering, L.HIJ* ; Herczog, M. ; Du, M. ; Eikema, K. S. E. ; Witte, S. (Corresponding author)

2022
Soc. Washington, DC

This record in other databases:  

Please use a persistent id in citations: doi:10.1364/OL.453655

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Contributing Institute(s):

1. HI Jena (HIJ)

Research Program(s):

1. 622 - Detector Technologies and Systems (POF4-622) (POF4-622)
2. 3D-VIEW - Seeing the invisible: Light-based 3D imaging of opaque nanostructures (864016) (864016)

Experiment(s):

1. External experiment at external facility/ no experiment at GSI (POF3; other)

Appears in the scientific report 2022

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Database coverage:
; Clarivate Analytics Master Journal List ; Current Contents - Electronics and Telecommunications Collection ; Current Contents - Engineering, Computing and Technology ; Current Contents - Physical, Chemical and Earth Sciences ; Essential Science Indicators ; IF < 5 ; JCR ; SCOPUS ; Science Citation Index Expanded ; Web of Science Core Collection

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