TY  - JOUR
AU  - Schulze, Kai-Sven
TI  - Determination of the reflectivity of crystals by ptychography
JO  - AIP Advances
VL  - 12
IS  - 12
SN  - 2158-3226
CY  - New York, NY
PB  - American Inst. of Physics
M1  - GSI-2023-00015
SP  - 125219
PY  - 2022
N1  - All article content, except where otherwise noted, is licensed under a Creative Commons Attribution (CC BY) license (http://creativecommons.org/licenses/by/4.0/)
LB  - PUB:(DE-HGF)16
UR  - <Go to ISI:>//WOS:000899365700009
DO  - DOI:10.1063/5.0102867
UR  - https://repository.gsi.de/record/250699
ER  -