<?xml version="1.0" encoding="UTF-8"?>
<collection>
<oai_dc:dc xmlns:dc="http://purl.org/dc/elements/1.1/" xmlns:dcterms="http://purl.org/dc/terms/" xmlns:oai_dc="http://www.openarchives.org/OAI/2.0/oai_dc/" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xsi:schemaLocation="http://www.openarchives.org/OAI/2.0/oai_dc/ http://www.openarchives.org/OAI/2.0/oai_dc.xsd http://dublincore.org/schemas/xmls/qdc/dcterms.xsd"><dc:language>eng</dc:language><dc:creator>Schulze, Kai-Sven</dc:creator><dc:title>Determination of the reflectivity of crystals by ptychography</dc:title><dc:subject>info:eu-repo/classification/ddc/530</dc:subject><dc:source>AIP Advances 12(12), 125219 (2022). doi:10.1063/5.0102867</dc:source><dc:type>info:eu-repo/semantics/article</dc:type><dc:type>info:eu-repo/semantics/publishedVersion</dc:type><dc:publisher>American Inst. of Physics</dc:publisher><dc:date>2022</dc:date><dc:rights>info:eu-repo/semantics/openAccess</dc:rights><dc:coverage>DE</dc:coverage><dc:identifier>https://repository.gsi.de/record/250699</dc:identifier><dc:identifier>https://repository.gsi.de/search?p=id:%22GSI-2023-00015%22</dc:identifier><dc:audience>Researchers</dc:audience><dc:relation>info:eu-repo/semantics/altIdentifier/doi/10.1063/5.0102867</dc:relation><dc:relation>info:eu-repo/semantics/altIdentifier/issn/2158-3226</dc:relation><dc:relation>info:eu-repo/semantics/altIdentifier/wos/WOS:000899365700009</dc:relation><dc:relation>info:eu-repo/semantics/altIdentifier/doi/10.15120/GSI-2023-00015</dc:relation></oai_dc:dc>

</collection>