Home > Publications database > Measured and simulated depth-profiles of fragments induced by 200 MeV/u 40Ar ion beam in copper
 
This record has no copies.
Similar records

GSI Repository: Search Submit Personalize Help
Powered by Invenio v1.1.7 | join2_v2606
Contact: Content: gsilibrary@gsi.de Technical questions: invenio-service@gsi.de

GSI Helmholtzzentrum für Schwerionenforschung GmbH | Planckstr. 1 | 64291 Darmstadt | Telefon: +49-6159-71- 0

Legal notice / Impressum | Data privacy protection / Datenschutz