TY  - JOUR
AU  - Dutt, Shankar
AU  - Chakraborty, Rudradeep
AU  - Notthoff, Christian
AU  - Mota-Santiago, Pablo
AU  - Trautmann, Christina
AU  - Kluth, Patrick
TI  - Characterization of ion track-etched conical nanopores in thermal and PECVD SiO 2 using small angle X-ray scattering
JO  - Beilstein journal of nanotechnology
VL  - 16
SN  - 2190-4286
CY  - Frankfurt, M.
PB  - Beilstein-Institut zur Förderung der Chemischen Wissenschaften
M1  - GSI-2025-01194
SP  - 899 - 909
PY  - 2025
N1  - This is an open access article licensed under the terms of the Beilstein-Institut Open Access License Agreement (https://www.beilstein-journals.org/bjnano/terms), which is identical to the Creative Commons Attribution 4.0 International License (https://creativecommons.org/licenses/by/4.0). The reuse of material under this license requires that the author(s), source and license are credited. Third-party material in this article could be subject to other licenses (typically indicated in the credit line), and in this case, users are required to  obtain permission from the license holder to reuse the material.
LB  - PUB:(DE-HGF)16
C6  - pmid:40589922
UR  - <Go to ISI:>//WOS:001533391100001
DO  - DOI:10.3762/bjnano.16.68
UR  - https://repository.gsi.de/record/362558
ER  -