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  <ref-type name="Conference Paper">47</ref-type>
  <contributors>
    <authors>
      <author>Matejcek, Franz</author>
      <author>Altingun, Ali-Murteza</author>
      <author>Andary, Julio</author>
      <author>Arnoldi-Meadows, Benedict</author>
      <author>Baudot, Jerome</author>
      <author>Bertolone, Gregory</author>
      <author>Besson, Auguste</author>
      <author>Bialas, Norbert</author>
      <author>Braun, Christopher</author>
      <author>Bugiel, Roma</author>
      <author>Claus, Gilles</author>
      <author>Colledani, Claude</author>
      <author>Darwish, Hasan</author>
      <author>Deveaux, Michael</author>
      <author>Dorokhov, Andrei</author>
      <author>Dozière, Guy</author>
      <author>Bitar, Ziad El</author>
      <author>Fröhlich, Ingo</author>
      <author>Goffe, Mathieu</author>
      <author>Gutsche, Benedikt</author>
      <author>Himmi, Abdelkader</author>
      <author>Hu-Guo, Christine</author>
      <author>Jaaskelainen, Kimmo</author>
      <author>Keller, Oliver</author>
      <author>Koziel, Michal</author>
      <author>Michel, Jan</author>
      <author>Morel, Frederic</author>
      <author>Müntz, Christian</author>
      <author>Pham, Hung</author>
      <author>Schmidt, Christian Joachim</author>
      <author>Schreiber, Stefan</author>
      <author>Specht, Matthieu</author>
      <author>Stroth, Joachim</author>
      <author>Taka, Eva-dhidho</author>
      <author>Valin, Isabelle</author>
      <author>Weirich, Roland</author>
      <author>Zhao, Yüe</author>
      <author>Winter, Marc</author>
    </authors>
    <subsidiary-authors>
      <author>DTL</author>
      <author>HAD</author>
      <author>CBM@FAIR</author>
      <author>CBM</author>
    </subsidiary-authors>
  </contributors>
  <titles>
    <title>Integration concept of the CBM Micro Vertex Detector</title>
    <secondary-title>Journal of Instrumentation</secondary-title>
    <secondary-title>11th International Workshop on Semiconductor Pixel Detectors for    Particles and Imaging (PIXEL)</secondary-title>
  </titles>
  <periodical>
    <full-title>Journal of Instrumentation</full-title>
  </periodical>
  <publisher>Inst. of Physics</publisher>
  <pub-location>London</pub-location>
  <pub-location>Strasbourg, France</pub-location>
  <isbn>1748-0221</isbn>
  <electronic-resource-num>10.1088/1748-0221/20/06/C06024</electronic-resource-num>
  <pages>C06024</pages>
  <number>06</number>
  <volume>20</volume>
  <abstract/>
  <notes>
    <note> Published by IOP Publishing Ltd on behalf of Sissa Medialab. Original content from this work may be used under the terms of the Creative Commons Attribution 4.0 licence. ; </note>
  </notes>
  <label>33, ; PUB:(DE-HGF)16, ; PUB:(DE-HGF)8, ; </label>
  <keywords/>
  <accession-num>WOS:001515760600001</accession-num>
  <work-type>Journal Article</work-type>
  <dates>
    <pub-dates>
      <year>2025</year>
    </pub-dates>
    <date>2024-11-18 - 2024-11-22</date>
  </dates>
  <accession-num>GSI-2026-00350</accession-num>
  <date>2024-11-18 - 2024-11-22</date>
  <year>2025</year>
  <urls>
    <related-urls>
      <url>https://repository.gsi.de/record/364997</url>
      <url>https://doi.org/10.1088/1748-0221/20/06/C06024</url>
      <url>&lt;Go to ISI&gt;://WOS:001515760600001</url>
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