Journal Article

GSI-2026-00681

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Low-lying E 1 strength in $^{20}$O

Tryggestad, E. ; Baumann, T. ; Heckman, P. ; Thoennessen, M. ; Aumann, T.GSI* ; Bazin, D. ; Blumenfeld, Y. ; Beene, J. R. ; Lewis, T. A. ; Radford, D. C. ; Shapira, D. ; Varner, R. L. ; Chartier, M. ; Halbert, M. L. ; Liang, J. F.

2003
Inst. Woodbury, NY

This record in other databases:

Please use a persistent id in citations: doi:10.1103/PhysRevC.67.064309

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Contributing Institute(s):

1. Bibliothek & Dokumentation GSI (BUD)

Research Program(s):

1. 899 - ohne Topic (POF4-899) (POF4-899)

Experiment(s):

1. (Facility Altdaten therefore no facility)

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Database coverage:
; Clarivate Analytics Master Journal List ; Current Contents - Electronics and Telecommunications Collection ; Current Contents - Physical, Chemical and Earth Sciences ; Ebsco Academic Search ; Essential Science Indicators ; IF < 5 ; JCR ; SCOPUS ; Science Citation Index Expanded ; Web of Science Core Collection

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