| Home > Publications database > High-Precision Metrology of Highly Charged Ions via Relativistic Resonance Fluorescence > RIS |
TY - JOUR AU - Postavaru, O. AU - Harman, Z. AU - Keitel, C. H. TI - High-Precision Metrology of Highly Charged Ions via Relativistic Resonance Fluorescence JO - Physical review letters VL - 106 IS - 3 SN - 1079-7114 CY - College Park, Md. PB - APS M1 - GSI-2013-00286 SP - 033001 PY - 2011 LB - PUB:(DE-HGF)16 C6 - pmid:21405269 UR - <Go to ISI:>//WOS:000286742200006 DO - DOI:10.1103/PhysRevLett.106.033001 UR - https://repository.gsi.de/record/48090 ER -