Demonstration of charge breeding in a compact room temperature electron beam ion trap

Vorobjev, G. Sokolov, A. Thorn, A. Herfurth, F. Kester, O. Quint, W. Stöhlker, Thomas Zschornack, G.

ATP PRO

Review of scientific instruments

American Institute of Physics

[S.l.]

0034-6748

10.1063/1.4719668

English 053302 - 5 83 PUB:(DE-HGF)16, ; 0, ;

WOS:000304821500018

Journal Article

2012

GSI-2013-02341

2012 pmid:22667612

https://repository.gsi.de/record/50719 https://doi.org/10.1063/1.4719668 <Go to ISI>://WOS:000304821500018