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| Hauptseite > GSI Scientific Reports > SR2012 > Characterization of double sided silicon micro-strip sensors with a pulsed infra-red laser system for the CBM experiment > print |
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| 100 | 1 | _ | |0 P:(DE-Ds200)OR5576 |a Ghosh, P. |b 0 |u gsi |
| 245 | _ | _ | |a Characterization of double sided silicon micro-strip sensors with a pulsed infra-red laser system for the CBM experiment |
| 260 | _ | _ | |a Darmstadt |b GSI Helmholtzzentrum für Schwerionenforschung |c 2013 |
| 295 | 1 | 0 | |a Scientific Report 2012 |
| 300 | _ | _ | |a 48 p. |
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| 500 | _ | _ | |a Experiment : CBM |
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| 856 | 4 | _ | |y SR2012-PHN-NQM-EXP-19 |
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