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| Hauptseite > GSI Scientific Reports > SR2012 > Characterization of a Si(Li) Compton polarimeter for the hard x-ray regime, using synchrotron radiation. > Zugang zum Volltext |
Characterization of a Si(Li) Compton polarimeter for the hard x-ray regime, using synchrotron radiation.
- GSI-SR2012-PNI-IONS-EXP-14
Main document Datei(en):
 PNI-IONS-EXP-14
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