Journal Article

GSI-2014-00858

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Intricate stepline artifact can mimic true atomic resolution in atomic force microscopy

Ohnesorge, F. (Corresponding author)GSI*

2000
APS College Park, Md.

This record in other databases:

Please use a persistent id in citations: doi:10.1103/PhysRevB.61.R5121

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Contributing Institute(s):

1. Materialforschung (MAT)

Research Program(s):

1. 899 - ohne Topic (POF2-899) (POF2-899)

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Database coverage:
; Current Contents - Social and Behavioral Sciences ; JCR ; Nationallizenz ; SCOPUS ; Science Citation Index ; Science Citation Index Expanded ; Thomson Reuters Master Journal List ; Web of Science Core Collection

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