Contribution to a conference proceedings/Contribution to a book

GSI-2014-01546

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Beam-Based Tests Of Intercepting Transverse Profile Diagnostics For FAIR

Forck, P. (Corresponding Author)GSI* ; Andre, C.GSI* ; Dorn, C.GSI* ; Ensinger, W. ; Haseitl, R.GSI* ; Lieberwirth, A.GSI* ; Lederer, S. ; Löchner, S.GSI* ; Reiter, A.GSI* ; Schwickert, M.GSI* ; Sieber, T.GSI* ; Walasek-Höhne, B.GSI* ; Witthaus, M.GSI*

2014

ISBN: 978-3-95450-132-8

Abstract: FAIR will serve as a versatile accelerator for ions ofenergies between 200 MeV/u and 29 GeV/u (FAIR startversion) with an intensity variation from some 103 to1013 ppp. In the transport lines the transverse profiledetermination will be mainly based on interceptingmethods: Scintillation screens, SEM-Grids and gas filledMWPCs. These devices are tested at the existing GSISIS18where ions are extracted either in fast mode within 1 μs or slow mode within 0.3 s. The imagingproperties of scintillation screens were investigated. Overintensities 107 to 109 ppp the light output for the screens islinear with respect to the ion intensity. Wire-basedmethods using SEM-Grids and MWPCs are discussed.

Note: BMBF under contract number 05P12RDRBJ, TU-Darmstadt

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Contributing Institute(s):

1. Beam Diagnostics (BEA)
2. Experimentelektronik (EEL)

Research Program(s):

1. 899 - ohne Topic (POF2-899) (POF2-899)
2. SUC-GSI-Darmstadt - Strategic university cooperation GSI-TU Darmstadt (SUC-GSI-DA) (SUC-GSI-DA)

Appears in the scientific report 2014

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