Journal Article

GSI-2014-02675

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png High precision measurement of undulator polarization in the regime of hard x-rays

Marx, B. (Corresponding Author) ; Schulze, K. S.HIJ* ; Uschmann, I.HIJ* ; Kämpfer, T.GSI* ; Wehrhan, O.GSI* ; Wille, H. C. ; Schlage, K. ; Röhlsberger, R. ; Weckert, E. ; Förster, E.HIJ* ; Stöhlker, T.GSI* ; Paulus, G. G.HIJ*

2014
American Inst. of Physics Melville, NY

This record in other databases:

Please use a persistent id in citations: doi:10.1063/1.4890584

---

Contributing Institute(s):

1. HI Jena (HIJ)
2. Atomphysik (ATP)
3. External Helmholtz Institute: HIJ (HIJ)

Research Program(s):

1. 544 - In-house Research with PNI (POF2-544) (POF2-544)

Appears in the scientific report 2014

---

Database coverage:
; Current Contents - Physical, Chemical and Earth Sciences ; IF < 5 ; JCR ; Nationallizenz ; SCOPUS ; Science Citation Index ; Science Citation Index Expanded ; Thomson Reuters Master Journal List ; Web of Science Core Collection

---