%0 Book Section
%A Folkmann, Finn
%A Mann, Rido
%A Beyer, Heinrich F.
%Y Fabian, Derek J.
%Y Kleinpoppen, Hans
%Y Watson, Lewis M.
%T Selective Electron Capture into Highly Charged Ions Studied by X-Rays and Auger Electrons
%C Boston, MA
%I Springer US
%M GSI-2016-00025
%P 145-150
%D 1981
%< Inner-Shell and X-Ray Physics of Atoms and Solids / Fabian, Derek J. (Editor)   ; Boston, MA : Springer US, 1981, Chapter 23 ; ISBN: 978-1-4615-9238-9 ; doi:10.1007/978-1-4615-9236-5
%F PUB:(DE-HGF)7
%9 Contribution to a book
%R 10.1007/978-1-4615-9236-5_23
%U https://repository.gsi.de/record/184255