Contribution to a book GSI-2016-00025

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Selective Electron Capture into Highly Charged Ions Studied by X-Rays and Auger Electrons

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1981
Springer US Boston, MA

Inner-Shell and X-Ray Physics of Atoms and Solids / Fabian, Derek J. (Editor) ; Boston, MA : Springer US, 1981, Chapter 23 ; ISBN: 978-1-4615-9238-9 ; doi:10.1007/978-1-4615-9236-5 Boston, MA : Springer US 145-150 () [10.1007/978-1-4615-9236-5_23]

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Contributing Institute(s):
  1. Atomphysik (ATP)
Research Program(s):
  1. 899 - ohne Topic (POF3-899) (POF3-899)

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 Record created 2016-01-12, last modified 2023-03-17