| Home > Publications database > Selective Electron Capture into Highly Charged Ions Studied by X-Rays and Auger Electrons |
| Contribution to a book | GSI-2016-00025 |
; ; ; ; ;
1981
Springer US
Boston, MA
Please use a persistent id in citations: doi:10.1007/978-1-4615-9236-5_23
|
The record appears in these collections: |