| Hauptseite > Publikationsdatenbank > Selective Electron Capture into Highly Charged Ions Studied by X-Rays and Auger Electrons > RIS |
TY - CHAP AU - Folkmann, Finn AU - Mann, Rido AU - Beyer, Heinrich F. A3 - Fabian, Derek J. A3 - Kleinpoppen, Hans A3 - Watson, Lewis M. TI - Selective Electron Capture into Highly Charged Ions Studied by X-Rays and Auger Electrons CY - Boston, MA PB - Springer US M1 - GSI-2016-00025 SP - 145-150 PY - 1981 LB - PUB:(DE-HGF)7 DO - DOI:10.1007/978-1-4615-9236-5_23 UR - https://repository.gsi.de/record/184255 ER -