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| Home > Publications database > The MAXEBIS at GSI as a test ion source for charge breeding and for HITRAP |
| Journal Article | GSI-2017-00588 |
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2008
American Institute of Physics
[S.l.]
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Please use a persistent id in citations: doi:10.1063/1.2823900
Abstract: The electron beam ion source MAXEBIS, developed and built at the University of Frankfurt, hasbeen installed at GSI to serve as an offline test ion source for the HITRAP project and for use as atest setup for charge breeding explorations. The setup has been equipped with new diagnostics andbeam optics devices. Two ion sources dedicated to the production of singly charged ions for externalion injection into the MAXEBIS have been included. First time of flight TOF spectra with externalinjected, charge-bred argon ions were taken. However, these spectra indicated beam losses in thebeam transport from the multipassage spectrometer MPS to the MAXEBIS. In order to understandthe losses, the beam transport has been simulated with the SIMION code and the beam line has beenmodified accordingly. Measurements of the MAXEBIS’ beam emittance, using the “nondestructive”beam profile method, have been performed as well as measurements of the electron current densityvia charge state analysis of the TOF spectra. The injection and breeding efficiency of the MAXEBIShave been determined for the first time. The results of the measurements and the plannedexperiments will be discussed.
- ddc:530
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