%0 Journal Article
%A Petzold, Stefan
%A Sharath, S. U.
%A Lemke, Jonas
%A Hildebrandt, Erwin
%A Trautmann, Christina
%A Alff, Lambert
%T Heavy Ion Radiation Effects on Hafnium Oxide-Based Resistive Random Access Memory
%J IEEE transactions on nuclear science
%V 66
%N 7
%@ 1558-1578
%C New York, NY
%I IEEE
%M GSI-2019-00806
%P 1715 - 1718
%D 2019
%F PUB:(DE-HGF)16
%9 Journal Article
%U <Go to ISI:>//WOS:000476782600048
%R 10.1109/TNS.2019.2908637
%U https://repository.gsi.de/record/219017