Journal Article

GSI-2019-00806

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Heavy Ion Radiation Effects on Hafnium Oxide-Based Resistive Random Access Memory

Petzold, S. (Corresponding author) ; Sharath, S. U. ; Lemke, J. ; Hildebrandt, E. ; Trautmann, C.GSI* ; Alff, L.

2019
IEEE New York, NY

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Please use a persistent id in citations: doi:10.1109/TNS.2019.2908637

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Contributing Institute(s):

1. Materialforschung (MAT)

Research Program(s):

1. 6214 - Nanoscience and Materials for Information Technology (POF3-621) (POF3-621)
2. GSI-EXP-UMAT-ohneJahr - Material Science Proposals at the UNILAC (EXP:GSI-EXP-UMAT-ohneJahr) (EXP:GSI-EXP-UMAT-ohneJahr)
3. FAIR Phase-0 - FAIR Phase-0 Research Program (GSI-FAIR-Phase-0) (GSI-FAIR-Phase-0)
4. GSI Beamtime 2018 - GSI beamtime in the year 2018 (GSI-Beamtime-2018) (GSI-Beamtime-2018)

Appears in the scientific report 2019

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Database coverage:
; Clarivate Analytics Master Journal List ; Current Contents - Engineering, Computing and Technology ; Current Contents - Physical, Chemical and Earth Sciences ; Ebsco Academic Search ; IF < 5 ; JCR ; SCOPUS ; Science Citation Index ; Science Citation Index Expanded ; Web of Science Core Collection

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