TY  - JOUR
AU  - Petzold, Stefan
AU  - Sharath, S. U.
AU  - Lemke, Jonas
AU  - Hildebrandt, Erwin
AU  - Trautmann, Christina
AU  - Alff, Lambert
TI  - Heavy Ion Radiation Effects on Hafnium Oxide-Based Resistive Random Access Memory
JO  - IEEE transactions on nuclear science
VL  - 66
IS  - 7
SN  - 1558-1578
CY  - New York, NY
PB  - IEEE
M1  - GSI-2019-00806
SP  - 1715 - 1718
PY  - 2019
LB  - PUB:(DE-HGF)16
UR  - <Go to ISI:>//WOS:000476782600048
DO  - DOI:10.1109/TNS.2019.2908637
UR  - https://repository.gsi.de/record/219017
ER  -