TY  - JOUR
AU  - Mustafin, Edil
AU  - Katrík, Peter
AU  - Pavlovič, Márius
AU  - Weick, Helmut
TI  - Measured and simulated depth-profiles of fragments induced by 200 MeV/u 40Ar ion beam in copper
JO  - Nuclear instruments & methods in physics research / B
VL  - 531
SN  - 0168-583x
CY  - Amsterdam [u.a.]
PB  - Elsevier
M1  - GSI-2023-00086
SP  - 82 - 92
PY  - 2022
N1  - CC BY-NC-ND 4.0
LB  - PUB:(DE-HGF)16
UR  - <Go to ISI:>//WOS:000868577600010
DO  - DOI:10.1016/j.nimb.2022.09.022
UR  - https://repository.gsi.de/record/250834
ER  -