Journal Article

GSI-2023-00086

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Measured and simulated depth-profiles of fragments induced by 200 MeV/u 40Ar ion beam in copper

Mustafin, E. (Corresponding author)GSI* ; Katrík, P.GSI* ; Pavlovič, M. ; Weick, H.GSI*

2022
Elsevier Amsterdam [u.a.]

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Please use a persistent id in citations: doi:10.1016/j.nimb.2022.09.022  doi:10.15120/GSI-2023-00086

Note: CC BY-NC-ND 4.0

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Contributing Institute(s):

1. Accelerator Physics (APH)
2. P-Linac / P-Bar-Target (PLI)
3. System Planning SFRS (SFS)

Research Program(s):

1. 6G12 - FAIR (GSI) (POF4-6G12) (POF4-6G12)
2. FAIR Phase-0 - FAIR Phase-0 Research Program (GSI-FAIR-Phase-0) (GSI-FAIR-Phase-0)

Experiment(s):

1. S451: Depth profiling of activity induced by lost heavy ions (POF3-612; HFS)

Appears in the scientific report 2022

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Database coverage:
; ; ; Clarivate Analytics Master Journal List ; Current Contents - Engineering, Computing and Technology ; Current Contents - Physical, Chemical and Earth Sciences ; Ebsco Academic Search ; Essential Science Indicators ; IF < 5 ; JCR ; Nationallizenz ; SCOPUS ; Science Citation Index Expanded ; Web of Science Core Collection

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