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S451
S451: Depth profiling of activity induced by lost heavy ions (POF3-612; HFS)
| Coordinator | Katrik, P. |
| Categories | Experiment |
| Identifier | EXP:(DE-Ds200)S451-20200803 |
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Journal Article
Measured and simulated depth-profiles of fragments induced by 200 MeV/u 40Ar ion beam in copper
Nuclear instruments & methods in physics research / B 531, 82 - 92 (2022) [10.1016/j.nimb.2022.09.022]
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Record created 2020-10-13, last modified 2022-10-01