Journal Article

GSI-2013-00364

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Measurements of high energy loss rates of fast highly charged U ions channeled in thin silicon crystals

Ray, C. (Corresponding author) ; Bräuning-Demian, A.GSI* ; Bräuning, H.GSI* ; Chevallier, M. ; Cohen, C. ; Dauvergne, D. ; L’Hoir, A. ; Kozhuharov, C.GSI* ; Liesen, D.GSI* ; Mokler, P. H. ; Poizat, J.-C. ; Stöhlker, T.GSI* ; Testa, E. ; Toulemonde, M.

2011
APS College Park, Md.

This record in other databases:

Please use a persistent id in citations: doi:10.1103/PhysRevB.84.024119

---

Contributing Institute(s):

1. Atomphysik (ATP)

Research Program(s):

1. 543 - Ions (POF2-543) (POF2-543)
2. HIJ - Helmholtz-Institut Jena (HGF-HIJ) (HGF-HIJ)

Appears in the scientific report 2011

---

Database coverage:
; Current Contents - Social and Behavioral Sciences ; JCR ; Nationallizenz ; SCOPUS ; Science Citation Index ; Science Citation Index Expanded ; Thomson Reuters Master Journal List ; Web of Science Core Collection

---