Contribution to a book/Internal Report

GSI-SR2014-APPA-MML-MR-16

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png XPS measurements on single Bi$_{2}$Te$_{3}$ nanowires fabricated by electrodeposition in etched ion-track membranes

Krieg, J.GSI* ; Chen, C. ; Avila, J. ; Trautmann, C.GSI* ; Asensio, M. C. ; Toimil Molares, M. E.GSI*

2015
GSI Helmholtzzentrum für Schwerionenforschung Darmstadt

Please use a persistent id in citations: doi:10.15120/GR-2015-1-APPA-MML-MR-16

Report No.: GSI Report 2015-1

Note: DFG (No. SPP 1666

---

Contributing Institute(s):

1. Materialforschung (MAT)
2. Bibliothek & Dokumentation (BUD)

Research Program(s):

1. 899 - ohne Topic (POF2-899) (POF2-899)
2. 544 - In-house Research with PNI (POF2-544) (POF2-544)
3. HGF-IVF-VH-GS-201 - HGS-HIRe : (HGF-IVF-VH-GS-201) (HGF-IVF-VH-GS-201)

Appears in the scientific report 2014

---

Database coverage:
;

---