Journal Article

GSI-2025-01194

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Characterization of ion track-etched conical nanopores in thermal and PECVD SiO 2 using small angle X-ray scattering

Dutt, S. (Corresponding author) ; Chakraborty, R. ; Notthoff, C. ; Mota-Santiago, P. ; Trautmann, C.GSI* ; Kluth, P.

2025
Beilstein-Institut zur Förderung der Chemischen Wissenschaften Frankfurt, M.

Please use a persistent id in citations: doi:10.3762/bjnano.16.68

Note: This is an open access article licensed under the terms of the Beilstein-Institut Open Access License Agreement (https://www.beilstein-journals.org/bjnano/terms), which is identical to the Creative Commons Attribution 4.0 International License (https://creativecommons.org/licenses/by/4.0). The reuse of material under this license requires that the author(s), source and license are credited. Third-party material in this article could be subject to other licenses (typically indicated in the credit line), and in this case, users are required to obtain permission from the license holder to reuse the material.

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Contributing Institute(s):

1. Materialforschung (MAT)

Research Program(s):

1. 632 - Materials – Quantum, Complex and Functional Materials (POF4-632) (POF4-632)

Experiment(s):

1. UMat: Material Science Proposals at the UNILAC (POF3-6214; X0)

Appears in the scientific report 2025

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Database coverage:
; ; ; Clarivate Analytics Master Journal List ; Current Contents - Physical, Chemical and Earth Sciences ; DOAJ Seal ; Essential Science Indicators ; IF < 5 ; JCR ; SCOPUS ; Science Citation Index Expanded ; Web of Science Core Collection

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