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High Aspect Ratio Nanotubes fabricated by Ion-Track Technology and Atomic Layer Deposition
Spende, A.GSI* ; Alber, I.GSI* ; Sobel, N. ; Hess, C. ; Lukas, M. ; Stühn, B. ; Zierold, R. ; Montero Moreno, J. M. ; Nielsch, K. ; Trautmann, C.GSI* ; Toimil Molares, M. E.GSI*
2014
GSI Helmholtzzentrum für Schwerionenforschung
Darmstadt
2014Scientific Report 2013
Darmstadt : GSI Helmholtzzentrum für Schwerionenforschung, GSI Report 2014-1, 180 p. (2014) [10.15120/GR-2014-1-PNI-MF-04]2014
Please use a persistent id in citations: doi:10.15120/GR-2014-1-PNI-MF-04
Report No.: GSI Report 2014-1
Contributing Institute(s):
- Materialforschung (MAT)
- Bibliothek & Dokumentation (BUD)
Research Program(s):
- 543 - Ions (POF2-543) (POF2-543)
- HGF-IVF-VH-GS-201 - HGS-HIRe : (HGF-IVF-VH-GS-201) (HGF-IVF-VH-GS-201)
Appears in the scientific report
2014
Database coverage: