Journal Article

GSI-2026-00311

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Structural and Electrical Behavior of Swift Heavy Ion Irradiated Hafnium Oxide Polymorphs in Ferroelectric and Resistive Memories

Schreyer, P. (Corresponding author) ; Lehninger, D. ; Vogel, T. ; Zhang, T. ; Kim, T. ; Piros, E. ; Li, Y. ; Duan, Y. ; Lederer, M. ; Seidel, K. ; Trautmann, C.GSI* ; Toimil Molares, M. E.GSI* ; Alff, L.

2025
Wiley-VCH Verlag GmbH & Co. KG Weinheim

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Please use a persistent id in citations: doi:10.1002/aelm.202500631  doi:10.15120/GSI-2026-00311

Note: This is an open access article under the terms of the Creative Commons Attribution License 4.

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Contributing Institute(s):

1. Materialforschung (MAT)
2. Collaboration FAIR: MAT (MAT@FAIR)

Research Program(s):

1. 632 - Materials – Quantum, Complex and Functional Materials (POF4-632) (POF4-632)
2. 6G15 - GSI-MML Ion Facilities (POF4-6G15) (POF4-6G15)
3. FAIR Phase-0 - FAIR Phase-0 Research Program (GSI-FAIR-Phase-0) (GSI-FAIR-Phase-0)

Experiment(s):

1. UMat: Material Science Proposals at the UNILAC (POF3-6214; M1; M2; M3)
2. UMat: Material Science Proposals at the UNILAC (POF3-6214; X0)

Appears in the scientific report 2025

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